Imaging and characterization of $\gamma$' and $\gamma$” nanoparticles in Inconel 718 by EDX elemental mapping and FIB-SEM tomography / K. KULAWIK, P. A. BUFFAT, A. KRUK, A. M. Wusatowska-Sarnek, A. CZYRSKA-FILEMONOWICZ // Materials Characterization : an International Journal on Materials Structure and Behavior ; ISSN 1044-5803. — 2015 vol. 100, s. 74–80. — Bibliogr. s. 80, Abstr.. — P. A. Buffat – dod. afiliacja: Ecole Polytechnique Fédérale de Lausanne. — tekst: http://www.sciencedirect.com/science/article/pii/S1044580314003908/pdfft?md5=1e76f62b53da6b23e9fc1925fdbf07e0&pid=1-s2.0-S1044580314003908-main.pdf