A microscopic and spectroscopic investigations in $CuO_{X}-CeO_{2-\delta}/Si$ thin films — Mikroskopowe i spektroskopowe badania cienkich warstw $CuO_{X}-CeO_{2-\delta}/Si$ / A. KOPIA, K. KOWALSKI, Ch. Leroux, M. CHMIELOWSKA // Archives of Metallurgy and Materials / Polish Academy of Sciences. Committee of Metallurgy. Institute of Metallurgy and Materials Science ; ISSN 1733-3490. — 2008 vol. 53 iss. 1 spec. iss., s. 157–160. — Bibliogr. 160. — Zastosowano procedurę peer review. — SOTAMA : symposium on Texture and microstructure analysis : September 26–28, 2007, Cracow, Poland / guest eds. Jerzy Jura, Ewa Bełtowska, Jan T. Bonarski ; Institute of Metallurgy and Materials Science of the Polish Academy of Sciences, Cracow. — Warszawa ; Kraków : PAS. Committee of Metallurgy. Institute of Metallurgy and Materials Science, 2008

${Ce_{1-x}Nd_{x}O_{2-\delta}/Si}$ thin films obtained by pulsed laser deposition: microstructure and conduction properties / M. CHMIELOWSKA, S. Villain, A. KOPIA, J. P. Dallas, J. KUSIŃSKI, J. R. Gavarri, Ch. Leroux // Thin Solid Films ; ISSN 0040-6090. — 2008 vol. 516 iss. 12, s. 3747–3754. — Bibliogr. s. 3754, Abstr.. — tekst: http://www-1sciencedirect-1com-1atoz.wbg2.bg.agh.edu.pl/science/article/pii/S0040609007011224/pdfft?md5=f1f0dab48e2dbacefdbf36a794f047ba&pid=1-s2.0-S0040609007011224-main.pdf

Electron microscopy and spectroscopy investigations of $CuO_{x}-CeO_{2-\delta}/Si$ thin films / A. KOPIA, K. KOWALSKI, M. CHMIELOWSKA, Ch. Leroux // Surface Science ; ISSN 0039-6028. — 2008 vol. 602 iss. 7, s. 1313–1321. — Bibliogr. s. 1320–1321, Abstr.. — Publikacja dostępna online od: 2008-01-11. — M. Chmielowska - pierwsza afiliacja: Université du Sud Toulon-Var, France. — tekst: http://goo.gl/zWfb6M