Application of ChemiSTEM EDX to elemental mapping of $\gamma'$ and $\gamma”$ nanoparticles in Inconel 718 superalloy / K. KULAWIK, P. A. BUFFAT, B. DUBIEL, A. CZYRSKA-FILEMONOWICZ // W: emc2012 Manchester [Dokument elektroniczny] : proceedings of the 15th European Microscopy Congress : 16th–21st September 2012, Manchester, UK / RMS The Royal Microscopical Society, IFSM International Federation of Societies for Microscopy. — Wersja do Windows. — Dane tekstowe. — [UK : s. n.], [2012]. — 1 dysk optyczny. — S. [1–2]. — Wymagania systemowe: Adobe Reader ; napęd CD. — Bibliogr. s. [1–2]. — Tyt. przejeto z ekranu tytułowego. — Dod. afiliacja autora: P. A. Buffat'a: Ecole Polytechnique Fédérale de Lausanne

Chemical element mapping and metrology of $\gamma$' and $\gamma$” nanoparticles in Inconel 718 superalloy for aeronautics and power generation / A. CZYRSKA-FILEMONOWICZ, P. Buffat, K. KULAWIK // W: MC 2013 Regensburg : August 25–30, 2013, Regensburg, Germany : proceedings. — Germany : [s. n.], 2013. — S. 547–548

Imaging and characterization of $\gamma$' and $\gamma$” nanoparticles in Inconel 718 by EDX elemental mapping and FIB-SEM tomography / K. KULAWIK, P. A. BUFFAT, A. KRUK, A. M. Wusatowska-Sarnek, A. CZYRSKA-FILEMONOWICZ // Materials Characterization : an International Journal on Materials Structure and Behavior ; ISSN 1044-5803. — 2015 vol. 100, s. 74–80. — Bibliogr. s. 80, Abstr.. — P. A. Buffat – dod. afiliacja: Ecole Polytechnique Fédérale de Lausanne. — tekst: http://www.sciencedirect.com/science/article/pii/S1044580314003908/pdfft?md5=1e76f62b53da6b23e9fc1925fdbf07e0&pid=1-s2.0-S1044580314003908-main.pdf

Metrology and morphology of $\gamma$' and $\gamma$” nanoparticles in Inconel 718 measured by FIB-SEM tomography / K. KULAWIK, B. DUBIEL, A. CZYRSKA-FILEMONOWICZ // Diffusion and Defect Data – Solid State Data. Part B, Solid State Phenomena ; ISSN 1012-0394. — 2013 vol. 197, s. 131–136. — Bibliogr. s. 136, Abstr.. — STERMAT : Stereology and image analysis in Materials science : 9th international conference : Zakopane, 3rd–6th September 2012

Three-dimensional visualization and metrology of nanoparticles in Inconel 718 by electron tomography / Krzysztof KULAWIK, Adam KRUK, Beata DUBIEL, Aleksandra CZYRSKA-FILEMONOWICZ // Diffusion and Defect Data – Solid State Data. Part B, Solid State Phenomena ; ISSN 1012-0394. — 2012 vol. 186, s. 45–48. — Bibliogr. s. 48, Abstr.. — Electron Microscopy XIV : selected peer reviewed papers from the XIV international conference on Electron Microscopy (EM 2011) : June 26–30, 2011, Wisla, Poland / ed. Danuta Stróż, Krystian Prusik. — Durnten-Zurich : Trans Tech Publications Ltd, cop. 2012. — ISBN-13 978-3-03785-381-8. — tekst: http://www.scientific.net/SSP.186.45.pdf