Microstructure of ${Sr_{4}Ru_{2}O_{9}}$ thin films and ${Bi_{3.25}La_{0.75}Ti_{3}O_{12}/Sr_{4}Ru_{2}O_{9}}$ bilayers / R. CHMIELOWSKI, V. Madigou, M. BLICHARSKI, Ch. Leroux // W: EMC 2008 : 14th European Microscopy Congress : 1–5 September 2008, Aachen, Germany. Vol. 2, Materials science / eds. Silvia Richter, Alexander Schwedt. — Berlin ; Heidelberg : Springer-Verlag, cop. 2008. — ISBN: 978-3-540-85225-4. — S. 347–348. — Bibliogr. s. 348

Structural analyses of the thin films $CeO_{2}$ doping Cu / M. KLIMCZAK, A. KOPIA, R. CHMIELOWSKI, J. KUSIŃSKI, I. SULIGA // W: XI International conference on Electron microscopy of solids : Krynica, Poland, 19–23 May 2002 : abstracts / org.: Institute of Metallurgy and Materials Science of Polish Academy of Sciences, Microscopy Section of Committee on Materials Science of Polish Academy of Sciences, Polish Materials Society. — [Poland : PAS], [2002]. — S. 123

Structural analysis of $Sr_{n+1}Ru_{n}O_{3n+1}$ thin films elaborated by laser ablation technique / R. CHMIELOWSKI, V. Madigou, M. A. Frémy, M. BLICHARSKI, G. Nihoul // W: microCEM : workshop on “Progress in microstructure Characterization by Electron Microscopy” : 30 September – 2 October 2005, Zakopane, Poland : book of abstracts. — Krakow : Polish Academy of Sciences. Institute of Metallurgy and Materials Science, 2005. — S. 41, P 11

TEM microstructure investigation of ferroelectric and conductive oxide thin films obtained by pulsed laser deposition technique / R. CHMIELOWSKI, V. Madigou, M. BLICHARSKI, Ch. Leroux // W: IMC16 : 16th International Microscopy Congress : Microscopy for the 21st century : 3–8 September 2006 Sapporo, Japan : proceedings. Vol. 3, Materials science / eds. Hideki Ichinose, Takahisa Sasaki. — [Japan : Publication committee of IMC16], [2006]. — S. 1753