Characterization of the glass-coated CoSb3 thermoelectric material by electron microscopy / Kinga ZAWADZKA, Oleksandr KRYSHTAL, Marek NOCUŃ, Elżbieta GODLEWSKA, Aleksandra CZYRSKA-FILEMONOWICZ // W: EMC 2016 : European Microscopy Congress 2016. Vol. 2[.2], Materials science / ed. by Odile Stéphan, Martin Hytch, Thierry Epicier. — Weinheim : Wiley-VCH Verlag GmbH, 2016. — ISBN: 978-3-527-34299-0. — S. 926–927. — Błąd w zapisie nazwiska: O. Krysthal

Combinatorial study of gradient Ag-Al thin films: microstructure, phase formation, mechanical and electrical properties / Fang Mao, Mamoun Taher, Oleksandr KRYSHTAL, Adam KRUK, Aleksandra CZYRSKA-FILEMONOWICZ, Mikael Ottosson, Anna M. Andersson, Urban Wiklund, Ulf Jansson // ACS Applied Materials & Interfaces ; ISSN 1944-8244. — 2016 vol. 8 iss. 44, s. 30635–30643. — Bibliogr. s. 30642–30643, Abstr.. — Publikacja dostępna online od: 2016-10-17

Glass coating/$CoSb_{3}$ interface: characterization by transmission electron microscopy / K. ZAWADZKA, E. GODLEWSKA, O. KRYSHTAL, M. NOCUŃ, A. CZYRSKA-FILEMONOWICZ, M. Chmielewski, R. Zybała // W: ECT 2016 [Dokument elektroniczny] : 14\textsuperscript{th} European Conference on Thermoelectrics : Lisbon, Portugal, 20–23 September 2016 : book of abstracts / Instituto Superior Técnico. Universidade de Lisboa. — Wersja do Windows. — Dane tekstowe. — [Lisbon : s. n.], [2016]. — Dysk Flash. — S. 173. — Wymagania systemowe: Adobe Reader

On the mechanism of metal-induced crystallization: an in situ TEM study of nanosized Au/Ge films : [abstract] / Aleksandr KRYSHTAL, Alexey Minenkov, Paulo Ferreira // W: EMC 2016 : European Microscopy Congress 2016. Vol. 2[.1], Materials science / ed. by Odile Stéphan, Martin Hytch, Thierry Epicier. — Weinheim : Wiley-VCH Verlag GmbH, 2016. — ISBN: 978-3-527-34299-0. — S. 7–8. — O. Kryshtal - dod. afiliacja: Karazin Kharkiv National University, Ukraine

TEM basics / Oleksandr KRYSHTAL // W: The 5\textsuperscript{th} Stanisław Gorczyca European school on Electron microscopy and electron tomography : Kraków, 5-8.07.2016 : proceedings / ed. by G. Cempura, A. Gruszczyński, A. Czyrska-Filemonowicz ; AGH University of Science and Technology, International Centre of Electron Microscopy for Materials Science, Faculty of Metals Engineering and Industrial Computer Science. — Kraków : AGH University of Science and Technology, 2016. — Opis częśc. wg okł.. — ISBN: 978-83-63663-81-0. — S. 9–23. — Bibliogr. s. 9