Wykaz publikacji wybranego autora

Oleksander Kryshtal, dr hab., prof. AGH

profesor nadzwyczajny

Wydział Inżynierii Metali i Informatyki Przemysłowej
WIMiIP-kmm, Katedra Metaloznawstwa i Metalurgii Proszków

  • 2018

    [dyscyplina 1] dziedzina nauk inżynieryjno-technicznych / inżynieria materiałowa

Identyfikatory Autora Informacje o Autorze w systemach zewnętrznych

ORCID: 0000-0002-6528-8821 orcid iD

ResearcherID: G-2094-2016

Scopus: 66024065553

PBN: 602b70c09543c7410626dd44

OPI Nauka Polska

System Informacyjny AGH (SkOs)

1
  • Characterization of gold rich nanostructures on AIII-BV semiconductor surfaces by electron microscopy and machine learning techniques
2
  • Characterization of the glass-coated CoSb3 thermoelectric material by electron microscopy
3
  • Chemical and structural imaging of gold-rich nanostructures on AIIIBV semiconductors by electron microscopy and machine learning
4
  • Contact melting in Ag/Ge layered nanofilms: critical thickness and onset temperature
5
  • De-wetting of nanosized binary films: a case study on Au-Ge
6
  • Effect of electron beam irradiation in TEM on the local temperature of Au-Ge nanoparticle
7
  • Effect of gadolinium segregation to grain boundaries in $Cr_{2}O_{3}$ scale on the physicochemical properties of Crofer 22 APU ferritic steel with a spinel coating
8
  • Glass coating/$CoSb_{3}$ interface: characterization by transmission electron microscopy
9
  • Growth mechanism of $Cr_{2}O_{3}$ scale formed on chromium implanted with yttrium
10
  • In situ aberration-corrected STEM studies of metal-induced crystallization of amorphous semiconductor films
11
  • In situ TEM study of kinetics of Ag-induced crystallization of amorphous Ge films
12
  • Kinetics of Ag-induced crystallization of amorphous Ge films probed by EELS plasmon mapping in TEM
13
  • Kinetics of melting-crystallization on single Sn nanoparticles: a HR STEM–EELS study
14
  • Krystalograficzne pochodzenie zmian reżimu przewodnictwa elektrycznego dla nano-złącza metal-półprzewodnik (M-S)
15
  • Liquid-like migration of solid Ni islands on amorphous carbon substrate
16
  • Melting and crystallization of nanosized Bi films confined between Ge layers
17
  • Melting process and the size dependence of the eutectic temperature of Ag-Ge films
18
  • Metal-induced crystallization of amorphous semiconductor films: nucleation phenomena in $Ag-Ge$ couples
19
  • Microscopic investigations of a Cr2O3 scale formed on a substrate with implanted yttrium ions
20
  • Microstructure and phase composition of the Ag-Al film wear track: through-thickness characterization by advanced electron microscopy
21
  • On the Au-Ni equilibrium phase diagram for 6 nm sized nanoparticles
22
  • On the liquid phase stability in nanoscale layered Bi-Ge films: an \emph {in situ} TEM study
23
  • On the mechanism of metal-induced crystallization: an in situ TEM study of nanosized Au/Ge films
24
  • Phase transformations in nanoscale metal-semiconductor couples: in situ (S)TEM studies
25
  • Proces samoorganizacji nanostruktur tlenku tytanu (TiO) na powierzchniach termicznie redukowanych kryształów $SrTiO_{3}(110)$