Effect of silicon additions in CrSi (10, 20, 30, 40 at. \% Si) magnetron targets on microstructure of reactively (Cr, Si) N coatings / Justyna Grzonka, Ryszard MANIA, Janos Labar, Jerzy Morgiel // Diffusion and Defect Data – Solid State Data. Part B, Solid State Phenomena ; ISSN 1012-0394. — 2012 vol. 186, s. 182–187. — Bibliogr. s. 187, Abstr.. — Electron Microscopy XIV : selected peer reviewed papers from the XIV international conference on Electron Microscopy (EM 2011) : June 26–30, 2011, Wisla, Poland / ed. Danuta Stróż, Krystian Prusik. — Durnten-Zurich : Trans Tech Publications Ltd, cop. 2012. — ISBN-13 978-3-03785-381-8. — tekst: http://www.scientific.net/SSP.186.182.pdf